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Electric Chracterization

Title Authors Citation
Topographical modification of silicon oxide using a conducting atomic-force microscope S.Kremmer, E.Pischler,C.Teichert, F.Kuchar Proceedings of IEEE-NANO 2001 - 1st IEEE Conference on Nanotechnology, Maui, Hawaii, 2001 (IEEE, Piscataway, NJ, 2001), p. 162-167
Conducting Atomic-force Microscopy Investigations on Thin Silicon Gate Oxides: Influence of Tip Shape and Humidity S.Kremmer, S.Peissl, C.Teichert, F.Kuchar Proc. 28th Int. Symposium for Testing and Failure Analysis, Nov 3-7, 2002, Phoenix, Arizona p.473-482 (2002)
Characterization of silicon gate oxides by conducting atomic-force microscopy S.Kremmer, C.Teichert, E.Pischler, H.Gold, F.Kuchar, M.Schatzmayr Surf. Interf. Anal. 33 (2002) 168-172
Modification and Characterization of Thin Silicon Gate Oxides using Conducting Atomic-Force Microscopy S.Kremmer, S.Peissl,C.Teichert, F.Kuchar, H.Hofer Mat. Sci Eng. B 102, 88-93 (2003)
Nanoscale morphological and electrical homogeneity of HfO2 and ZrO2 thin films studied by conducting atomic-force microscopy S.Kremmer, H.Wurmbauer, C.Teichert, G. Tallarida, S.Spiga, C.Wiemer, M.Fanciulli Journal of Applied Physics 97, 074315(2005)
Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110) Tejedor, P.; Díez-Merino, L.; Beinik, I.; Teichert, C. Appl. Phys. Lett., 2009, 95, 123103
PHOTOCONDUCTIVITY AND FIELD-ASSISTED PHTOEMISSION IN MULTILAYER Si/Ge HETEROSTRUCTURES WITH QUANTUM DOTS Kondratenko, S.; Vakulenko, O.; Kozyrev, Y.; Rubezhanska, M.; Dadykin, A.; Naumovets, A. G.; Hofer, C.; Teichert, C. Ukrainian journal of physics, 2010, 55, 381-387
Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge Beinik, I.; Galiana, B.; Kratzer, M.; Teichert, C.; Rey-Stolle, I.; Algora, C. .; Tejedor, P. Journal of vacuum science & technology, 2010, 28, C5G5-C5G10
Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy Schloffer, M.; Teichert, C.; Supancic, P.; Andreev, A.; Hou, Y.; Wang, Z. Journal of the European Ceramic Society, 2010, 30, 1761-1764
Photovoltaic properties and photoconductivity in multilayer Ge/Si heterostructures with Ge nanoislands. Kondratenko, S.; Vakulenko, O. V.; Kozyrev, Y. N.; Rubezhanska, M. Y.; Naumovets, A. G.; Nikolenko, A. S.; Lysenko, V. S.; Strelchuk, V. V.; Teichert, C. J. Mater. Sci., 2011, 46, 5737-5742
Electrical properties of ZnO nanorods studied by conductive atomic force microscopy Beinik, I.; Kratzer, M.; Wachauer, A.; Wang, L.; Lechner, R.; Teichert, C.; Motz, C.; Anwand, W.; Brauer, G.; Chen, X. .; Hsu, Y. F.; Djuricis, A. J. Appl. Phys., 2011, 110, 052005-052005
Effect of Ge nanoislands on lateral photoconductivity of Ge-SiOx-Si structures. Lysenko, V. S.; Gomeniuk, Y. V.; Kozyrev, Y. N.; Rubezhanska, M. Y.; Sklyar, V.; Kondratenko, S.; Melnichuk, Y.; Teichert, C. Adv. Mat. Res., 2011. 276, 179-186
Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications Galiana, B.; Rey-Stolle, I.; Beinik, I.; Teichert, C.; Algora, C.; Molina-Aldareguia, J. M.; Tejedor, P. Sol. Energ. Mat. Sol. C., 2011, 1949-4954
Carrier transfer effect on transport in p-i-n structures with Ge quantum dots Lysenko, V.; Gomeniuk, Y. V.; Strelchuk, V. V.; Nikolenko, A. S.; Kondratenko, S.; Kozyrev, Y. N.; Rubezhanska, M. Y.; Teichert, C. Phys. Rev. B., 2011, 84, 115425
Structural, electrical and magnetic measurements on oxide layers grown on 316L exposed to liquid lead–bismuth eutectic Hosemann, P.; Hofer, C.; Hlawacek, G.; Li, N.; Maloy, S. A.; Teichert, C. J. Nucl. Mater., 2012, 421, 140-146
Patterned Modulation of the Conductivity of Polyaniline by Means of Photolithography Grießer, T.; Radl, S.; Pavitschitz, A.; Teichert, C.; Edler, M.; Köpplmayr, T.; Rath, T.; Trimmel, G.; Schwabegger, G.; Simbrunner, C.; Sitter, H.; Kern, W. Chem. Mater., 2012, 22, 2922
Ion beam irradiation of cuprate high-temperature superconductors: Systematic modification of the electrical properties and fabrication of nanopatterns Lang, W.; Marksteiner, M.; Bodea, M. A.; Siraj, K.; Pedarnig, J. D.; Kolarova, R.; Bauer, P.; Hasengrübler, K. .; Hasenfuss, C.; Beinik, I.; Teichert, C. Nucl. Instrum. Meth. B, 2012, 300-304