| Title | Authors | Citation |
| 2001 |
| Topographical modification of silicon oxide using a conducting atomic-force microscope | S.Kremmer, E.Pischler,C.Teichert, F.Kuchar | Proceedings of IEEE-NANO 2001 - 1st IEEE Conference on Nanotechnology, Maui, Hawaii, 2001 (IEEE, Piscataway, NJ, 2001), p. 162-167 |
| 2002 |
| Conducting Atomic-force Microscopy Investigations on Thin Silicon Gate Oxides: Influence of Tip Shape and Humidity | S.Kremmer, S.Peissl, C.Teichert, F.Kuchar | Proc. 28th Int. Symposium for Testing and Failure Analysis, Nov 3-7, 2002, Phoenix, Arizona p.473-482 (2002) |
| Characterization of silicon gate oxides by conducting atomic-force microscopy | S.Kremmer, C.Teichert, E.Pischler, H.Gold, F.Kuchar, M.Schatzmayr | Surf. Interf. Anal. 33 (2002) 168-172 |
| 2003 |
| Modification and Characterization of Thin Silicon Gate Oxides using Conducting Atomic-Force Microscopy | S.Kremmer, S.Peissl,C.Teichert, F.Kuchar, H.Hofer | Mat. Sci Eng. B 102, 88-93 (2003) |
| 2005 |
| Nanoscale morphological and electrical homogeneity of HfO2 and ZrO2 thin films studied by conducting atomic-force microscopy | S.Kremmer, H.Wurmbauer, C.Teichert, G. Tallarida, S.Spiga, C.Wiemer, M.Fanciulli | Journal of Applied Physics 97, 074315(2005) |
| 2009 |
| Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110) | Tejedor, P.; Díez-Merino, L.; Beinik, I.; Teichert, C. | Appl. Phys. Lett., 2009, 95, 123103 |
| 2010 |
| PHOTOCONDUCTIVITY AND FIELD-ASSISTED PHTOEMISSION IN MULTILAYER Si/Ge HETEROSTRUCTURES WITH QUANTUM DOTS | Kondratenko, S.; Vakulenko, O.; Kozyrev, Y.; Rubezhanska, M.; Dadykin, A.; Naumovets, A. G.; Hofer, C.; Teichert, C. | Ukrainian journal of physics, 2010, 55, 381-387 |
| Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge | Beinik, I.; Galiana, B.; Kratzer, M.; Teichert, C.; Rey-Stolle, I.; Algora, C. .; Tejedor, P. | Journal of vacuum science & technology, 2010, 28, C5G5-C5G10 |
| Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy | Schloffer, M.; Teichert, C.; Supancic, P.; Andreev, A.; Hou, Y.; Wang, Z. | Journal of the European Ceramic Society, 2010, 30, 1761-1764 |
| 2011 |
| Photovoltaic properties and photoconductivity in multilayer Ge/Si heterostructures with Ge nanoislands. | Kondratenko, S.; Vakulenko, O. V.; Kozyrev, Y. N.; Rubezhanska, M. Y.; Naumovets, A. G.; Nikolenko, A. S.; Lysenko, V. S.; Strelchuk, V. V.; Teichert, C. | J. Mater. Sci., 2011, 46, 5737-5742 |
| Electrical properties of ZnO nanorods studied by conductive atomic force microscopy | Beinik, I.; Kratzer, M.; Wachauer, A.; Wang, L.; Lechner, R.; Teichert, C.; Motz, C.; Anwand, W.; Brauer, G.; Chen, X. .; Hsu, Y. F.; Djuricis, A. | J. Appl. Phys., 2011, 110, 052005-052005 |
| Effect of Ge nanoislands on lateral photoconductivity of Ge-SiOx-Si structures. | Lysenko, V. S.; Gomeniuk, Y. V.; Kozyrev, Y. N.; Rubezhanska, M. Y.; Sklyar, V.; Kondratenko, S.; Melnichuk, Y.; Teichert, C. | Adv. Mat. Res., 2011. 276, 179-186 |
| Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications | Galiana, B.; Rey-Stolle, I.; Beinik, I.; Teichert, C.; Algora, C.; Molina-Aldareguia, J. M.; Tejedor, P. | Sol. Energ. Mat. Sol. C., 2011, 1949-4954 |
| 2011 |
| Carrier transfer effect on transport in p-i-n structures with Ge quantum dots | Lysenko, V.; Gomeniuk, Y. V.; Strelchuk, V. V.; Nikolenko, A. S.; Kondratenko, S.; Kozyrev, Y. N.; Rubezhanska, M. Y.; Teichert, C. | Phys. Rev. B., 2011, 84, 115425 |
| 2012 |
| Structural, electrical and magnetic measurements on oxide layers grown on 316L exposed to liquid lead–bismuth eutectic | Hosemann, P.; Hofer, C.; Hlawacek, G.; Li, N.; Maloy, S. A.; Teichert, C. | J. Nucl. Mater., 2012, 421, 140-146 |
| Patterned Modulation of the Conductivity of Polyaniline by Means of Photolithography | Grießer, T.; Radl, S.; Pavitschitz, A.; Teichert, C.; Edler, M.; Köpplmayr, T.; Rath, T.; Trimmel, G.; Schwabegger, G.; Simbrunner, C.; Sitter, H.; Kern, W. | Chem. Mater., 2012, 22, 2922 |
| Ion beam irradiation of cuprate high-temperature superconductors: Systematic modification of the electrical properties and fabrication of nanopatterns | Lang, W.; Marksteiner, M.; Bodea, M. A.; Siraj, K.; Pedarnig, J. D.; Kolarova, R.; Bauer, P.; Hasengrübler, K. .; Hasenfuss, C.; Beinik, I.; Teichert, C. | Nucl. Instrum. Meth. B, 2012, 300-304 |
