Digital Instruments Multimode

Nanoscope III Multimode AFM from Digital Instruments is used for studying of various surfaces, among those are surfaces of semiconductors, metals, etc. It is well equipped with the set of cantilever holders, scanners and Q-modulator it can operate in few modes, such as: tunneling, contact mode AFM, tapping mode AFM, tapping mode in fluids, lateral force mode, conductive probe, electric force imaging and others.