Roughness Characterization

2008
Synthesis-structure relations for reactive magnetron sputtered V 25 filmsFateh, N.; Fontalvo, G.; Cha, L.; Klunsner, T.; Hlawacek, G.; Teichert, C. & Mitterer, C.Surf. Coat. Technol., 2008, 202, 1551-1555
2009
Structure, stresses and stress relaxation of TiN/Ag nanocomposite filmsKöstenbauer, H.; Fontalvo, G. A.; Mitterer, C.; Hlawacek, G.; Teichert, C. & Keckes, J.J. Nanosci. Nanotechnol., 2009, 9, 3606-3610
2011
Replication of Stochastic and Geometric Micro Structures. Aspects of Visual AppearanceBerger, G.; Gruber, D. P.; Friesenbichler, W.; Teichert, C.; Burgsteiner, M.International Polymer Processing, 2011, XXVI, 313-322